CG数据库 >> WaferPro Express 2016.04 HF2 x64

WaferPro Express 2016.04 简介WaferPro Express 是一款新软件平台,专门设计用于高效地执行自动化晶圆级测量。

WaferPro Express 帮助工程师降低晶圆级测量系统的复杂性,让他们能够快速设定和执行测试计划,以便分析测量数据。

WaferPro Express 能够驱动是德科技仪器(和选定的非是德科技仪器)和探针台控制软件(包含温度控制),并提供出色的数据处理和显示功能。

WaferPro Express 是我们与 Cascade Microtech 携手合作的产物,也是晶圆级测量解决方案(WMS)的核心软件。

WMS 配置包含是德科技仪器和软件、Cascade Microtech 晶圆探头台、附件和软件。

利用新的 Keysight Verification Substrate(KVS),工程师可以快速验证初始安装完毕的 WMS 系统。

每一套 KVS 已全面通过晶圆厂表征,并配备标准器件,让工程师能够在完成射频校准后使用 G-S-G 探头来进行探测。

WaferPro Express 2016.04 可以在初始系统验证过程中测量 KVS,然后,通过比较测量数据和晶圆厂数据,来确认系统是否正常运作。

WaferPro Express 2016.04进一步改善了与 Cascade Microtech Velox 2.0 探头台控制软件所独有的集成度。

通过 Cascade Microtech 与是德科技联合开发的 WaferSync,WaferPro Express 和 Velox 2.0 可以整合在一起。

WaferSync 支持完整的晶圆图同步功能,以提供简单、无误差的软件信息交换,包括晶圆对准、位点和裸片信息。

虽然以前版本添加了直接从 IC-CAP 导入例程的功能,不过 WaferPro Express 2016.04 更进一步增加了各种新器件类型、测试例程和示例等。

现在还首次提供了 Python 示例。

此外添加了新的 PEL 和 Python 教程。

它们介绍了编程如何帮助用户定制例程数据分析,或用客户的测量算法代替内部仪器驱动程序。

WaferPro Express 2016.04 现在能够运行部分测试计划。

当用户在整个晶圆运行完毕后想要重复某些测量时,这个特性尤其有用。

WaferPro Express 2016.04  | 767.8 mbKeysight Technologies, Inc.

introduced the latest release of its powerful WaferPro Express 2016.

04 software is a new software platform specifically designed to efficiently execute automated wafer-level measurements.

WaferPro Express helps to reduce wafer-level measurement system complexity and simplifies the everyday task of setting up and executing test plans to analyze measured data.

WaferPro Express drives Keysight (and select non-Keysight) instruments as well as prober control software (including temperature control), and provides powerful data handling and display capabilities.

WaferPro Express is also a key component of Wafer-level Measurement Solutions (WMS) from Keysight Technologies and Cascade Microtech.

WMS include Keysight instruments and software as well as Cascade Microtech wafer probers, accessories and software.

Verification of newly installed WMS systems is performed using the new Keysight Verification Substrate (KVS).

Each KVS is fully characterized at the factory and features standard devices that engineers can probe with G-S-G probes after RF calibration.

WaferPro Express 2016.

04 measures the KVS during initial system verification procedure.

Then, by comparing measured and factory data, it certifies the system’s proper operation.

WaferPro Express 2016.

04 further improves the exclusive integration with Cascade Microtech’s Velox 2.

0 prober control software.

WaferPro Express and Velox 2.

0 are integrated through Cascade Microtech’s WaferSync, a jointly developed two-way communication link.

The link allows for complete wafer map synchronization, which enables easy and error-free information exchange between the software, including wafer alignment, sites and die information.

While previous releases added the ability to import routines directly from IC-CAP, WaferPro Express 2016.

04 adds a variety of new device types, test routines and examples.

For the first time, Python examples are now provided.

In addition, new PEL and Python tutorials have been added.

These show how programming can help users to customize routine data analysis or replace internal instrument drivers with customer measurement algorithms.

WaferPro Express 2016.

04 now provides the ability to run partial test plans.

This feature is useful when users want to repeat certain measurements after a full wafer run.

Key features of WaferPro Express 2016.04- WaferPro Express is now the official software platform for the Advanced Low-Frequency Noise Analyzer (A-LFNA).

A-LFNA is a high-performance noise analyzer designed to make accurate and repeatable low frequency noise measurements.

- New factory device types, test algorithms and examples- New PEL and Python tutorials- Support for running partial test plans- Enhanced link to Cascade Microtech Velox 2.x (UI improvements and fixes)- Up to 3X speed improvements in B1500A, E5270A and other driversStarting with Version 2016.

04, WaferPro Express is the official software platform for the Advanced Low frequency Noise Analyzer (A-LFNA), a high-performance noise analyzer designed to make accurate and repeatable low frequency noise measurements.

Product:WaferPro ExpressVersion:2016.04 HF1Supported Architectures:64bitLanguage:englishSystem Requirements:PCSupported Operating Systems:Windows 7 Enterprise (SP1)Size:767.8 mb


WaferPro Express 2016.04 HF2 x64的图片1

发布日期: 2018-08-18